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High Mobility Cd3As2(112) on GaAs(001) Substrates Grown via Molecular Beam Epitaxy AITranslate

National Renewable Energy Laboratory;National Renewable Energy Laboratory;National Renewable Energy Laboratory;National Renewable Energy Laboratory;National Renewable Energy Laboratory
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Publisher: ACS
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Abstract AITranslate

The three-dimensional Dirac semimetal Cd3As2 exhibits ultrahigh electron mobilities that are attractive for optoelectronic devices. However, its strong propensity to grow in the (112) orientation limits the feasibility to epitaxially integrate it into semiconductor structures that are conventionally grown in the (001) orientation. Here, we demonstrate a route to epitaxially growing high mobility Cd3As2(112) layers on GaAs(001) substrates, opening up possibilities for device design. The (001) crystallographic orientation of the GaAs substrate is switched to the (111) orientation through a strain-driven process at a CdTe/GaAs interface, resulting in a CdTe(111) buffer layer on top of which Cd3As2 can be grown. Although the CdTe(111) buffer layer templates Cd3As2 in the (112) orientation, it is not sufficient for producing Cd3As2 with high electron mobility. We therefore demonstrate additional buffer layer design principles for realizing Cd3As2(112) epilayers with similar electron mobilities to those grown on lattice-mismatched III–V (111) substrates. Finally, we outline a pathway to use this approach to grow Cd3As2(112) epilayers on Si(001) substrates, further expanding the potential to integrate Cd3As2 into electronic devices.

KeyWords AITranslate

molecular beam epitaxy topological semimetals Cd3As2 thin films heterostructures
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Basic Information:

DOI:https://doi.org/10.1021/acsaelm.1c01126

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Citation Information:

The three-dimensional Dirac semimetal Cd3As2 exhibits ultrahigh electron mobilities that are attractive for optoelectronic devices. However, its strong propensity to grow in the (112) orientation limits the feasibility to epitaxially integrate it into semiconductor structures that are conventionally grown in the (001) orientation. Here, we demonstrate a route to epitaxially growing high mobility Cd3As2(112) layers on GaAs(001) substrates, opening up possibilities for device design. The (001) crystallographic orientation of the GaAs substrate is switched to the (111) orientation through a strain-driven process at a CdTe/GaAs interface, resulting in a CdTe(111) buffer layer on top of which Cd3As2 can be grown. Although the CdTe(111) buffer layer templates Cd3As2 in the (112) orientation, it is not sufficient for producing Cd3As2 with high electron mobility. We therefore demonstrate additional buffer layer design principles for realizing Cd3As2(112) epilayers with similar electron mobilities to those grown on lattice-mismatched III–V (111) substrates. Finally, we outline a pathway to use this approach to grow Cd3As2(112) epilayers on Si(001) substrates, further expanding the potential to integrate Cd3As2 into electronic devices.

quote

GB/T 7714-2015 [1] Anthony D. Rice, Jocienne Nelson, Andrew G. Norman, et al. ACS Applied Electronic Materials, 2022(4). DOI:10.1021/acsaelm.1c01126.
MLA [1] Anthony D. Rice, et al., ACS Applied Electronic Materials, no. 4, 2022, https://doi.org/10.1021/acsaelm.1c01126.
APA [1] Anthony D. Rice, Jocienne Nelson, Andrew G. Norman, Patrick Walker, & Kirstin Alberi. (2022). ACS Applied Electronic Materials(4). https://doi.org/10.1021/acsaelm.1c01126
IEEE [1] Anthony D. Rice, Jocienne Nelson, Andrew G. Norman, Patrick Walker, and Kirstin Alberi, ACS Applied Electronic Materials, no. 4, 2022, doi: 10.1021/acsaelm.1c01126. keywords: {molecular beam epitaxy topological semimetals Cd3As2 thin films heterostructures}