Low-Voltage and Highly Sensitive PbS Quantum Dot Thin-Film X-ray Monitors AITranslate

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DOI：https://doi.org/10.1021/acsaelm.3c00986

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In the past decade, lead sulfide quantum dots (PbS QDs) have been widely adopted for the fabrication of visible and infrared photodetectors, thanks to their unique properties such as a wide range of band gap tunability, high optical absorption, easy processability, as well as mechanical flexibility. Such characteristics may be also desirable for the realization of high-energy detectors, and the high atomic number of Pb suggests that PbS QDs could be effectively employed also at X-ray wavelengths. Here, we propose PbS QDs as a sensing material for X-ray detection. A homogeneous population of colloidal PbS QDs (3–4 nm) was synthesized with high purity and good yield (>70%) through a low-cost synthetic route. The colloidal solution of PbS QDs showed chemical and physical stabilities for over 6 months. A PbS QDs thin layer of about 2 μm thickness was obtained through a simple drop-casting deposition and slow evaporation. The device exhibited high sensitivity (2370 μC Gy–1 cm–2) and a good detection limit of 5 μGy s–1 to 23 keV hard X-rays at a 1 V bias. Such encouraging results pave the way for the use of PbS QD-based X-ray sensors for imaging applications, suggesting also future developments of low-power and high-sensitivity wearable sensors.