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Electron Tomography in the (S)TEM: From Nanoscale Morphological Analysis to 3D Atomic Imaging AITranslate

Zineb Saghi; Paul A. Midgley;
bionand (andalusian center for nanomedicine and biotechnology); university of cambridge
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Publisher: Elsevier
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Abstract AITranslate

In this short review, we discuss recent developments in electron tomography with examples across a range of materials science and nanotechnology. Challenges related to extending the resolution of the technique from the nanoscale to the atomic level are addressed, and the different routes proposed to meet those challenges are considered. We illustrate improvements in electron tomography brought about by recent developments in hardware and the advent of aberration-corrected microscopes. We focus also on developments in new reconstruction algorithms designed to enable reliable and accurate reconstructions from very limited projection data. These recent technique developments provide a genuine promise of routine 3D atomic imaging.

KeyWords AITranslate

transmission electron microscopy 3D imaging atomic resolution nanotechnology aberration correction reconstruction algorithms
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Basic Information:

DOI：https://doi.org/10.1146/annurev-matsci-070511-155019

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Citation Information:

In this short review, we discuss recent developments in electron tomography with examples across a range of materials science and nanotechnology. Challenges related to extending the resolution of the technique from the nanoscale to the atomic level are addressed, and the different routes proposed to meet those challenges are considered. We illustrate improvements in electron tomography brought about by recent developments in hardware and the advent of aberration-corrected microscopes. We focus also on developments in new reconstruction algorithms designed to enable reliable and accurate reconstructions from very limited projection data. These recent technique developments provide a genuine promise of routine 3D atomic imaging.

quote

GB/T 7714-2015 [1] Zineb Saghi, Paul A. Midgley. Annual Review of Materials Research, 2012(42). DOI:10.1146/annurev-matsci-070511-155019.
MLA [1] Zineb Saghi, and Paul A. Midgley. Annual Review of Materials Research, no. 42, 2012, https://doi.org/10.1146/annurev-matsci-070511-155019.
APA [1] Zineb Saghi, & Paul A. Midgley. (2012). Annual Review of Materials Research(42). https://doi.org/10.1146/annurev-matsci-070511-155019
IEEE [1] Zineb Saghi and Paul A. Midgley, Annual Review of Materials Research, no. 42, 2012, doi: 10.1146/annurev-matsci-070511-155019. keywords: {transmission electron microscopy;3D imaging;atomic resolution;nanotechnology;aberration correction;reconstruction algorithms}