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Atom Probe Tomography 2012 AITranslate

Thomas F. Kelly; David J. Larson;
ameca instruments, inc.;ameca instruments, inc.
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Publisher: Elsevier
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Abstract AITranslate

In the world of tomographic imaging, atom probe tomography (APT) occupies the high-spatial-resolution end of the spectrum. It is highly complementary to electron tomography and is applicable to a wide range of materials. The current state of APT is reviewed. Emphasis is placed on applications and data analysis as they apply to many fields of research and development including metals, semiconductors, ceramics, and organic materials. We also provide a brief review of the history and the instrumentation associated with APT and an assessment of the existing challenges in the field.

KeyWords AITranslate

local electrode atom probe atomicscale analysis LEAP APT
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Basic Information:

DOI：https://doi.org/10.1146/annurev-matsci-070511-155007

Chinese Library Classification Number:

Citation Information:

In the world of tomographic imaging, atom probe tomography (APT) occupies the high-spatial-resolution end of the spectrum. It is highly complementary to electron tomography and is applicable to a wide range of materials. The current state of APT is reviewed. Emphasis is placed on applications and data analysis as they apply to many fields of research and development including metals, semiconductors, ceramics, and organic materials. We also provide a brief review of the history and the instrumentation associated with APT and an assessment of the existing challenges in the field.

quote

GB/T 7714-2015 [1] Thomas F. Kelly, David J. Larson. Annual Review of Materials Research, 2012(42). DOI:10.1146/annurev-matsci-070511-155007.
MLA [1] Thomas F. Kelly, and David J. Larson. Annual Review of Materials Research, no. 42, 2012, https://doi.org/10.1146/annurev-matsci-070511-155007.
APA [1] Thomas F. Kelly, & David J. Larson. (2012). Annual Review of Materials Research(42). https://doi.org/10.1146/annurev-matsci-070511-155007
IEEE [1] Thomas F. Kelly and David J. Larson, Annual Review of Materials Research, no. 42, 2012, doi: 10.1146/annurev-matsci-070511-155007. keywords: {local electrode atom probe;atomicscale analysis;LEAP;APT}