Enhanced Electrical Properties of Optimized Vertical Graphene-Base Hot Electron Transistors Enhanced Electrical Properties of Optimized Vertical Graphene-Base Hot Electron Transistors AITranslate
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The arrival of high-mobility two-dimensional materials like graphene leads to the renaissance of former vertical semiconductor–metal–semiconductor (SMS) hot electron transistors. Because of the monolayer thickness of graphene, improved SMS transistors with a semimetallic graphene-base electrode are now feasible for high-frequency applications. In this study we report about a device that consists of amorphous silicon, graphene, and crystalline silicon. For the first time, this device is fabricated by a four-mask lithography process which leads to significant improvements in the device performance. A strongly increased common-emitter current gain of 2% could be achieved while the on–off ratio improved to 1.6 × 105, which is already higher than predicted theoretically. This could be mainly attributed to better interface characteristics and decreased lateral dimensions of the devices. A cutoff frequency of approximately 26 MHz could be forecasted based on the DC measurements of the device.
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DOI:https://doi.org/10.1021/acsaelm.2c01725
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The arrival of high-mobility two-dimensional materials like graphene leads to the renaissance of former vertical semiconductor–metal–semiconductor (SMS) hot electron transistors. Because of the monolayer thickness of graphene, improved SMS transistors with a semimetallic graphene-base electrode are now feasible for high-frequency applications. In this study we report about a device that consists of amorphous silicon, graphene, and crystalline silicon. For the first time, this device is fabricated by a four-mask lithography process which leads to significant improvements in the device performance. A strongly increased common-emitter current gain of 2% could be achieved while the on–off ratio improved to 1.6 × 105, which is already higher than predicted theoretically. This could be mainly attributed to better interface characteristics and decreased lateral dimensions of the devices. A cutoff frequency of approximately 26 MHz could be forecasted based on the DC measurements of the device.
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| GB/T 7714-2015 | [1] Carsten Strobel, Carlos A. Chavarin, Sandra Völkel, et al. ACS Applied Electronic Materials, 2023(5). DOI:10.1021/acsaelm.2c01725. |
| MLA | [1] Carsten Strobel, et al., ACS Applied Electronic Materials, no. 5, 2023, https://doi.org/10.1021/acsaelm.2c01725. |
| APA | [1] Carsten Strobel, Carlos A. Chavarin, Sandra Völkel, Andreas Jahn, Andre Hiess, Martin Knaut, Matthias Albert, Christian Wenger, Olaff Steinke, Ulf Stephan, Sören Röhlecke, & Thomas Mikolajick. (2023). ACS Applied Electronic Materials(5). https://doi.org/10.1021/acsaelm.2c01725 |
| IEEE | [1] Carsten Strobel, Carlos A. Chavarin, Sandra Völkel, Andreas Jahn, Andre Hiess, Martin Knaut, Matthias Albert, Christian Wenger, Olaff Steinke, Ulf Stephan, Sören Röhlecke, and Thomas Mikolajick, ACS Applied Electronic Materials, no. 5, 2023, doi: 10.1021/acsaelm.2c01725. keywords: {amorphous silicon graphene VHFPECVD high frequency transistor hot electron transistor heterojunction} |
