Specific Conductivity of a Ferroelectric Domain Wall Specific Conductivity of a Ferroelectric Domain Wall AITranslate
Abstract AITranslate
The small size of ferroelectric domain walls (FEDWs) presents a significant challenge for the accurate determination of their electrical properties. Quantification of their specific conductivity (σ), however, is essential for their implementation as functional elements and interconnects in nanoelectronic circuits. Here, we propose a scanning-probe-based method to directly determine the specific conductivity of a single FEDW in an insulating ferroelectric. The method eliminates complications due to size, current magnitude, and non-Ohmic electrical contacts. Transmission line spectroscopy measurements coupled with mean-field theory are able to provide quantitative insight into domain wall conductivity, shown here for prototypical 71° FEDWs in BiFeO3. These results provide significant insight into FEDWs, bringing applications in future nanoelectronic devices a step closer.
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DOI:https://doi.org/10.1021/acsaelm.2c00261
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The small size of ferroelectric domain walls (FEDWs) presents a significant challenge for the accurate determination of their electrical properties. Quantification of their specific conductivity (σ), however, is essential for their implementation as functional elements and interconnects in nanoelectronic circuits. Here, we propose a scanning-probe-based method to directly determine the specific conductivity of a single FEDW in an insulating ferroelectric. The method eliminates complications due to size, current magnitude, and non-Ohmic electrical contacts. Transmission line spectroscopy measurements coupled with mean-field theory are able to provide quantitative insight into domain wall conductivity, shown here for prototypical 71° FEDWs in BiFeO3. These results provide significant insight into FEDWs, bringing applications in future nanoelectronic devices a step closer.
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| GB/T 7714-2015 | [1] Pankaj Sharma, Anna N. Morozovska, Eugene A. Eliseev, et al. ACS Applied Electronic Materials, 2022(4). DOI:10.1021/acsaelm.2c00261. |
| MLA | [1] Pankaj Sharma, et al., ACS Applied Electronic Materials, no. 4, 2022, https://doi.org/10.1021/acsaelm.2c00261. |
| APA | [1] Pankaj Sharma, Anna N. Morozovska, Eugene A. Eliseev, Qi Zhang, Daniel Sando, Nagarajan Valanoor, & Jan Seidel. (2022). ACS Applied Electronic Materials(4). https://doi.org/10.1021/acsaelm.2c00261 |
| IEEE | [1] Pankaj Sharma, Anna N. Morozovska, Eugene A. Eliseev, Qi Zhang, Daniel Sando, Nagarajan Valanoor, and Jan Seidel, ACS Applied Electronic Materials, no. 4, 2022, doi: 10.1021/acsaelm.2c00261. keywords: {ferroelectrics domain walls scanning probe microscopy specific conductivity transmission line spectroscopy} |
