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Controlling Volatility and Nonvolatility of Memristive Devices by Sn Alloying Controlling Volatility and Nonvolatility of Memristive Devices by Sn Alloying AITranslate

Institute of Electromagnetic Fields (IEF);Institute of Electromagnetic Fields (IEF);Institute of Electromagnetic Fields (IEF);Institute of Electromagnetic Fields (IEF);Institute of Electromagnetic Fields (IEF);Integrated Systems Laboratory (IIS); Karlsruhe Institute of Technology;Integrated Systems Laboratory (IIS);Institute of Electromagnetic Fields (IEF);Institute of Electromagnetic Fields (IEF);Institute of Electromagnetic Fields (IEF);Integrated Systems Laboratory (IIS); Karlsruhe Institute of Technology;Institute of Electromagnetic Fields (IEF);Institute of Electromagnetic Fields (IEF)
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Publisher: ACS
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Abstract AITranslate

Memristive devices have attracted significant attention due to their downscaling potential, low power operation, and fast switching performance. Their inherent properties make them suitable for emerging applications such as neuromorphic computing, in-memory computing, and reservoir computing. However, the different applications demand either volatile or nonvolatile operation. In this study, we demonstrate how compliance current and specific material choices can be used to control the volatility and nonvolatility of memristive devices. Especially, by mixing different materials in the active electrode, we gain additional design parameters that allow us to tune the devices for different applications. We found that alloying Ag with Sn stabilizes the nonvolatile retention regime in a reproducible manner. Additionally, our alloying approach improves the reliability, endurance, and uniformity of the devices. We attribute these advances to stabilization of the filament inside the switching medium by the inclusion of Sn in the filament structure. These advantageous properties of alloying were found by investigating a choice of six electrode materials (Ag, Cu, AgCu-1, AgCu-2, AgSn-1, AgSn-2) and three switching layers (SiO2, Al2O3, HfO2).

KeyWords AITranslate

memristor memristive switching resistive switching alloy volatility electrochemical metallization cells
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Basic Information:

DOI:https://doi.org/10.1021/acsaelm.3c01275

Chinese Library Classification Number:

Citation Information:

Memristive devices have attracted significant attention due to their downscaling potential, low power operation, and fast switching performance. Their inherent properties make them suitable for emerging applications such as neuromorphic computing, in-memory computing, and reservoir computing. However, the different applications demand either volatile or nonvolatile operation. In this study, we demonstrate how compliance current and specific material choices can be used to control the volatility and nonvolatility of memristive devices. Especially, by mixing different materials in the active electrode, we gain additional design parameters that allow us to tune the devices for different applications. We found that alloying Ag with Sn stabilizes the nonvolatile retention regime in a reproducible manner. Additionally, our alloying approach improves the reliability, endurance, and uniformity of the devices. We attribute these advances to stabilization of the filament inside the switching medium by the inclusion of Sn in the filament structure. These advantageous properties of alloying were found by investigating a choice of six electrode materials (Ag, Cu, AgCu-1, AgCu-2, AgSn-1, AgSn-2) and three switching layers (SiO2, Al2O3, HfO2).

quote

GB/T 7714-2015 [1] Elias Passerini, Mila Lewerenz, Miklós Csontos, et al. ACS Applied Electronic Materials, 2023(5). DOI:10.1021/acsaelm.3c01275.
MLA [1] Elias Passerini, et al., ACS Applied Electronic Materials, no. 5, 2023, https://doi.org/10.1021/acsaelm.3c01275.
APA [1] Elias Passerini, Mila Lewerenz, Miklós Csontos, Nadia Jimenez Olalla, Killian Keller, Jan Aeschlimann, Fangqing Xie, Alexandros Emboras, Xinzhi Zhang, Markus Fischer, Yuriy Fedoryshyn, Mathieu Luisier, Thomas Schimmel, Ueli Koch, & Juerg Leuthold. (2023). ACS Applied Electronic Materials(5). https://doi.org/10.1021/acsaelm.3c01275
IEEE [1] Elias Passerini, Mila Lewerenz, Miklós Csontos, Nadia Jimenez Olalla, Killian Keller, Jan Aeschlimann, Fangqing Xie, Alexandros Emboras, Xinzhi Zhang, Markus Fischer, Yuriy Fedoryshyn, Mathieu Luisier, Thomas Schimmel, Ueli Koch, and Juerg Leuthold, ACS Applied Electronic Materials, no. 5, 2023, doi: 10.1021/acsaelm.3c01275. keywords: {memristor memristive switching resistive switching alloy volatility electrochemical metallization cells}