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Vacancy-Defect-Regulated Two-Dimensional Transition-Metal Dichalcogenides for Broadband Spectrum Photodetection Vacancy-Defect-Regulated Two-Dimensional Transition-Metal Dichalcogenides for Broadband Spectrum Photodetection AITranslate

Beijing University of Technology; Beijing University of Technology; Beijing University of Technology; Beijing University of Technology; Beijing University of Technology; Beijing University of Technology; Beijing University of Technology; Beijing University of Technology; Beijing University of Technology
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Publisher: ACS
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Abstract AITranslate

To take full use of the outstanding photoelectric properties of two-dimensional transition-metal dichalcogenides (2D TMDs), techniques for tuning their band gaps have been developed, among which defect engineering is found to be an effective way for broadband spectrum photodetection. Methods like pulsed laser deposition, thermal annealing, electron/proton beam etching, etc., can effectively reduce band gaps by introducing vacancy defects into TMDs, but they face the problems of high costs, uneven distribution of prepared defects, and unstable material properties. To solve these problems, we proposed a two-step strategy from “alloy synthesis” to “vacancy introduction”. Taking use of the bond energy differences between W–Se and W–Te in ternary alloy, WSe2(1–x)Te2x samples with homogeneous distributions of Se and Te were first synthesized, and then vacancy defects could be introduced through controllable release of Te atoms during a hydrogen-assisted annealing process, resulting in ∼4.1% vacancy defects with uniform distribution. A 910 nm photoluminescence (PL) peak appears in the annealed WSe2(1–x)Te2x, exhibiting a 110 nm red shift from the 800 nm peak of the unannealed alloy. Photoresponse of up to 1000 nm of the corresponding device verifies that a broadband spectrum detection TMD device has been successfully achieved in this study.

KeyWords AITranslate

twodimensional transitionmetal dichalcogenides chemical vapor deposition annealing defect engineering broadbandShow More
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Basic Information:

DOI:https://doi.org/10.1021/acsaelm.3c01326

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Citation Information:

To take full use of the outstanding photoelectric properties of two-dimensional transition-metal dichalcogenides (2D TMDs), techniques for tuning their band gaps have been developed, among which defect engineering is found to be an effective way for broadband spectrum photodetection. Methods like pulsed laser deposition, thermal annealing, electron/proton beam etching, etc., can effectively reduce band gaps by introducing vacancy defects into TMDs, but they face the problems of high costs, uneven distribution of prepared defects, and unstable material properties. To solve these problems, we proposed a two-step strategy from “alloy synthesis” to “vacancy introduction”. Taking use of the bond energy differences between W–Se and W–Te in ternary alloy, WSe2(1–x)Te2x samples with homogeneous distributions of Se and Te were first synthesized, and then vacancy defects could be introduced through controllable release of Te atoms during a hydrogen-assisted annealing process, resulting in ∼4.1% vacancy defects with uniform distribution. A 910 nm photoluminescence (PL) peak appears in the annealed WSe2(1–x)Te2x, exhibiting a 110 nm red shift from the 800 nm peak of the unannealed alloy. Photoresponse of up to 1000 nm of the corresponding device verifies that a broadband spectrum detection TMD device has been successfully achieved in this study.

quote

GB/T 7714-2015 [1] Jingtao Li, Yang Ma, Xiaoting Wang, et al. ACS Applied Electronic Materials, 2024(6). DOI:10.1021/acsaelm.3c01326.
MLA [1] Jingtao Li, et al., ACS Applied Electronic Materials, no. 6, 2024, https://doi.org/10.1021/acsaelm.3c01326.
APA [1] Jingtao Li, Yang Ma, Xiaoting Wang, Wenling Li, Jingjie Li, Mengchen Zhou, Hu Chen, Wei Gong, & Yongzhe Zhang. (2024). ACS Applied Electronic Materials(6). https://doi.org/10.1021/acsaelm.3c01326
IEEE [1] Jingtao Li, Yang Ma, Xiaoting Wang, Wenling Li, Jingjie Li, Mengchen Zhou, Hu Chen, Wei Gong, and Yongzhe Zhang, ACS Applied Electronic Materials, no. 6, 2024, doi: 10.1021/acsaelm.3c01326. keywords: {twodimensional transitionmetal dichalcogenides chemical vapor deposition annealing defect engineering broadbandShow More}