Kinetically Controlled Epitaxial Growth of Fe3GeTe2 van der Waals Ferromagnetic Films Kinetically Controlled Epitaxial Growth of Fe3GeTe2 van der Waals Ferromagnetic Films AITranslate
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We demonstrate that kinetics play an important role in the epitaxial growth of Fe3GeTe2 (FGT) van der Waals (vdW) ferromagnetic films by molecular beam epitaxy. By varying the deposition rate, we control the formation or suppression of an initial tellurium-deficient non-van-der-Waals phase (Fe3Ge2) prior to realizing epitaxial growth of the vdW FGT phase. Using cross-sectional scanning transmission electron microscopy and scanning tunneling microscopy, we optimize the FGT films to have atomically smooth surfaces and abrupt interfaces with the Ge(111) substrate. The magnetic properties of our high quality material are confirmed through magneto-optic, magnetotransport, and spin-polarized STM studies. Importantly, this demonstrates how the interplay of energetics and kinetics can help tune the re-evaporation rate of chalcogen atoms and interdiffusion from the underlayer, which paves the way for future studies of van der Waals epitaxy.
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DOI:https://doi.org/10.1021/acsaelm.2c00185
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We demonstrate that kinetics play an important role in the epitaxial growth of Fe3GeTe2 (FGT) van der Waals (vdW) ferromagnetic films by molecular beam epitaxy. By varying the deposition rate, we control the formation or suppression of an initial tellurium-deficient non-van-der-Waals phase (Fe3Ge2) prior to realizing epitaxial growth of the vdW FGT phase. Using cross-sectional scanning transmission electron microscopy and scanning tunneling microscopy, we optimize the FGT films to have atomically smooth surfaces and abrupt interfaces with the Ge(111) substrate. The magnetic properties of our high quality material are confirmed through magneto-optic, magnetotransport, and spin-polarized STM studies. Importantly, this demonstrates how the interplay of energetics and kinetics can help tune the re-evaporation rate of chalcogen atoms and interdiffusion from the underlayer, which paves the way for future studies of van der Waals epitaxy.
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| GB/T 7714-2015 | [1] Wenyi Zhou, Alexander J. Bishop, Menglin Zhu, et al. ACS Applied Electronic Materials, 2022(4). DOI:10.1021/acsaelm.2c00185. |
| MLA | [1] Wenyi Zhou, et al., ACS Applied Electronic Materials, no. 4, 2022, https://doi.org/10.1021/acsaelm.2c00185. |
| APA | [1] Wenyi Zhou, Alexander J. Bishop, Menglin Zhu, Igor Lyalin, Robert Walko, Jay A. Gupta, Jinwoo Hwang, & Roland K. Kawakami. (2022). ACS Applied Electronic Materials(4). https://doi.org/10.1021/acsaelm.2c00185 |
| IEEE | [1] Wenyi Zhou, Alexander J. Bishop, Menglin Zhu, Igor Lyalin, Robert Walko, Jay A. Gupta, Jinwoo Hwang, and Roland K. Kawakami, ACS Applied Electronic Materials, no. 4, 2022, doi: 10.1021/acsaelm.2c00185. keywords: {2D materials van der Waals magnet ferromagnetism molecular beam epitaxy growth kinetics transmission electron microscopyShow More} |
