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The Theory and Interpretation of Electron Energy Loss Near-Edge Fine Structure AITranslate

arizona state university; cornell university
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Publisher: Elsevier
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Abstract AITranslate

Electron energy loss fine structure near the threshold of inner-shell edges can potentially give valuable information on bonding on an atomic scale. To use near-edge structure it is essential to understand what factors influence both the occupied and unoccupied local density of states in the material of interest. Different techniques of electronic structure theory are suitable for metals, semiconductors, and ionic materials, although some methods can be applied to a wide range of systems. To extract quantitative information on bonding it is important to avoid those edges that are strongly affected by the presence of the core hole such as cations in ionic materials.

KeyWords AITranslate

inner shell electron microscope Xray absorption
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Basic Information:

DOI:https://doi.org/10.1146/annurev.matsci.37.052506.084209

Chinese Library Classification Number:

Citation Information:

Electron energy loss fine structure near the threshold of inner-shell edges can potentially give valuable information on bonding on an atomic scale. To use near-edge structure it is essential to understand what factors influence both the occupied and unoccupied local density of states in the material of interest. Different techniques of electronic structure theory are suitable for metals, semiconductors, and ionic materials, although some methods can be applied to a wide range of systems. To extract quantitative information on bonding it is important to avoid those edges that are strongly affected by the presence of the core hole such as cations in ionic materials.

quote

GB/T 7714-2015 [1] Peter Rez, David A. Muller. Annual Review of Materials Research, 2008(38). DOI:10.1146/annurev.matsci.37.052506.084209.
MLA [1] Peter Rez, and David A. Muller. Annual Review of Materials Research, no. 38, 2008, https://doi.org/10.1146/annurev.matsci.37.052506.084209.
APA [1] Peter Rez, & David A. Muller. (2008). Annual Review of Materials Research(38). https://doi.org/10.1146/annurev.matsci.37.052506.084209
IEEE [1] Peter Rez and David A. Muller, Annual Review of Materials Research, no. 38, 2008, doi: 10.1146/annurev.matsci.37.052506.084209. keywords: {inner shell;electron microscope;Xray absorption}