An Experimental Study of Carbon-Doped GaN via Solid–Gas Reaction Route and Investigation of Its Defect-Related Luminescence An Experimental Study of Carbon-Doped GaN via Solid–Gas Reaction Route and Investigation of Its Defect-Related Luminescence AITranslate
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Carbon-doped gallium nitride (GaN) is a very interesting material with applications in optoelectronic devices, and studies related to their defects offer insights regarding possible transitions based on the nature of the defects. A simple solid–gas reaction route has yielded carbon-doped GaN. An isolated CN defect state has been observed by spectroscopic tools (Fourier transform infrared spectroscopy, Raman spectroscopy, and X-ray photoelectron spectroscopy) along with the CN–ON complex formation. In addition to the red shift in the fundamental absorption band, a transition band was observed at ∼3.05 eV. A complete quenching of blue luminescence (BL) related to an oxygen defect and the appearance of a carbon-related yellow luminescence (YL) is shown in strongly doped samples. The origin of this defect-related YL in C-doped GaN is attributed to the carbon-defect CN (−1 charged) level transitions confirmed by absorption energy, photoluminescence (PL) peak position, and zero-phonon line.
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DOI:https://doi.org/10.1021/acsaelm.2c00619
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Carbon-doped gallium nitride (GaN) is a very interesting material with applications in optoelectronic devices, and studies related to their defects offer insights regarding possible transitions based on the nature of the defects. A simple solid–gas reaction route has yielded carbon-doped GaN. An isolated CN defect state has been observed by spectroscopic tools (Fourier transform infrared spectroscopy, Raman spectroscopy, and X-ray photoelectron spectroscopy) along with the CN–ON complex formation. In addition to the red shift in the fundamental absorption band, a transition band was observed at ∼3.05 eV. A complete quenching of blue luminescence (BL) related to an oxygen defect and the appearance of a carbon-related yellow luminescence (YL) is shown in strongly doped samples. The origin of this defect-related YL in C-doped GaN is attributed to the carbon-defect CN (−1 charged) level transitions confirmed by absorption energy, photoluminescence (PL) peak position, and zero-phonon line.
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| GB/T 7714-2015 | [1] Reetendra Singh, Anand Roy, C. N. R. Rao. ACS Applied Electronic Materials, 2022(4). DOI:10.1021/acsaelm.2c00619. |
| MLA | [1] Reetendra Singh, et al., ACS Applied Electronic Materials, no. 4, 2022, https://doi.org/10.1021/acsaelm.2c00619. |
| APA | [1] Reetendra Singh, Anand Roy, & C. N. R. Rao. (2022). ACS Applied Electronic Materials(4). https://doi.org/10.1021/acsaelm.2c00619 |
| IEEE | [1] Reetendra Singh, Anand Roy, and C. N. R. Rao, ACS Applied Electronic Materials, no. 4, 2022, doi: 10.1021/acsaelm.2c00619. keywords: {impurities nitrides gallium nitride doped gallium nitride solidstate reaction defects materials} |
