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Evaluating Mechanical Properties of Polymers at the Nanoscale Level via Atomic Force Microscopy–Infrared Spectroscopy AITranslate

Université libre de Bruxelles (ULB); Université libre de Bruxelles (ULB); Université libre de Bruxelles (ULB)
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Publisher: ACS
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Abstract AITranslate

The characterization and the optimization of packaging materials require accessing their composition with nanometric precision. A possible solution comes from atomic force microscopy–infrared spectroscopy (AFM–IR), capable of acquiring IR spectra with a spatial resolution surpassing the limit of infrared spectroscopy by far. Differentiating polyolefins, a typical component of packaging films, is complicated by the large similarity in the infrared response of this class of materials. Here, we propose a method with which to improve domains differentiation based on the analysis of IR spectra and viscoelastic properties, extracted via a routine similar to that employed in contact-resonance AFM.

KeyWords AITranslate

polymers AFM−IR subdiffraction resolution photothermally induced resonance
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Basic Information:

DOI:https://doi.org/10.1021/acsapm.8b00243

Chinese Library Classification Number:

Citation Information:

The characterization and the optimization of packaging materials require accessing their composition with nanometric precision. A possible solution comes from atomic force microscopy–infrared spectroscopy (AFM–IR), capable of acquiring IR spectra with a spatial resolution surpassing the limit of infrared spectroscopy by far. Differentiating polyolefins, a typical component of packaging films, is complicated by the large similarity in the infrared response of this class of materials. Here, we propose a method with which to improve domains differentiation based on the analysis of IR spectra and viscoelastic properties, extracted via a routine similar to that employed in contact-resonance AFM.

quote

GB/T 7714-2015 [1] Jehan Waeytens, Thomas Doneux, Simone Napolitano. ACS Applied Polymer Materials, 2019(1). DOI:10.1021/acsapm.8b00243.
MLA [1] Jehan Waeytens, et al., ACS Applied Polymer Materials, no. 1, 2019, https://doi.org/10.1021/acsapm.8b00243.
APA [1] Jehan Waeytens, Thomas Doneux, & Simone Napolitano. (2019). ACS Applied Polymer Materials(1). https://doi.org/10.1021/acsapm.8b00243
IEEE [1] Jehan Waeytens, Thomas Doneux, and Simone Napolitano, ACS Applied Polymer Materials, no. 1, 2019, doi: 10.1021/acsapm.8b00243. keywords: {polymers;AFM−IR;subdiffraction resolution;photothermally induced resonance}